Research Repository

Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy

Sidiroglou, Fotios and Stern, Richard and Fletcher, Ian and Huntington, Shane and Baxter, Gregory W and Roberts, Ann (2006) Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy. In: Optical Fibre Technology/Australian Optical Society, 2006(ACOFT&AOS2006). IEEE, pp. 97-99. ISBN 977565718

Full text for this resource is not available from the Research Repository.

Abstract

Dopant profiles in erbium doped optical fibres acquired by the application of fluorescence intensity based confocal microscopy technique and the employment of a nanoscale-secondary ion mass spectrometry (NanoSIMS) system are presented and compared

Item Type: Book Section
Uncontrolled Keywords: ResPubID: 11787, doping profiles, erbium, fluorescence spectroscopy, ion microprobe analysis, optical fibres, secondary ion mass spectroscopy
Subjects: FOR Classification > 0906 Electrical and Electronic Engineering
Faculty/School/Research Centre/Department > School of Engineering and Science
Depositing User: VUIR
Date Deposited: 13 Jan 2010 04:26
Last Modified: 21 Sep 2012 05:33
URI: http://vuir.vu.edu.au/id/eprint/2089
ePrint Statistics: View download statistics for this item
Citations in Scopus: 0 - View on Scopus

Repository staff only

View Item View Item

Search Google Scholar