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Application of a failure driven test profile in random testing

Chen, TY, Kuo, FC and Liu, Huai ORCID: 0000-0003-3125-4399 (2009) Application of a failure driven test profile in random testing. IEEE Transactions on Reliability, 58 (1). 179 - 192. ISSN 0018-9529

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Item Type: Article
Uncontrolled Keywords: adaptive random testing; uniform distribution; operational profile; testing algorithms; failure detection
Subjects: FOR Classification > 0803 Computer Software
Faculty/School/Research Centre/Department > College of Science and Engineering
Depositing User: Symplectic Elements
Date Deposited: 10 Jul 2017 04:13
Last Modified: 01 Nov 2017 06:50
URI: http://vuir.vu.edu.au/id/eprint/33050
DOI: https://doi.org/10.1109/TR.2008.2011687
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Citations in Scopus: 14 - View on Scopus

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