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Guest editorial: IMTC 2007 special issue

Thorn, Richard and Gao, R (2008) Guest editorial: IMTC 2007 special issue. IEEE Transactions on Instrumentation and Measurement, 57 (8). pp. 1502-1503. ISSN 0018-9456

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Abstract

The 24th Instrumentation and Measurement Technology Conference (IMTC 2007) had “Synergy of Science and Technology in Instrumentation and Technology” as its theme, emphasizing the multidisciplinary nature of measurement. The keynote lecture of the conference, entitled MEMS in Metrology, was given by Prof. R. Jachowicz which illustrated how microsystem technology is already playing a significant role in many measurement applications and discussed the increasingly important role such technology will have in the future.

Item Type: Article
Uncontrolled Keywords: ResPubID16505, Instrumentation and Measurement Technology Conference (IMTC), “Synergy of Science and Technology in Instrumentation and Technology”, multidisciplinary nature of measurement, microsystem technology, information management, instrumentation and measurement, instruments, metrology, micromechanical devices, peer to peer computing, space technology
Subjects: FOR Classification > 0906 Electrical and Electronic Engineering
Faculty/School/Research Centre/Department > School of Engineering and Science
Related URLs:
Depositing User: VUIR
Date Deposited: 21 Sep 2011 04:04
Last Modified: 21 Sep 2011 04:04
URI: http://vuir.vu.edu.au/id/eprint/3996
DOI: 10.1109/TIM.2008.926033
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Citations in Scopus: 0 - View on Scopus

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