Guest editorial: IMTC 2007 special issue
Thorn, Richard and Gao, R (2008) Guest editorial: IMTC 2007 special issue. IEEE Transactions on Instrumentation and Measurement, 57 (8). pp. 1502-1503. ISSN 0018-9456Full text for this resource is not available from the Research Repository.
The 24th Instrumentation and Measurement Technology Conference (IMTC 2007) had “Synergy of Science and Technology in Instrumentation and Technology” as its theme, emphasizing the multidisciplinary nature of measurement. The keynote lecture of the conference, entitled MEMS in Metrology, was given by Prof. R. Jachowicz which illustrated how microsystem technology is already playing a significant role in many measurement applications and discussed the increasingly important role such technology will have in the future.
|Uncontrolled Keywords:||ResPubID16505, Instrumentation and Measurement Technology Conference (IMTC), “Synergy of Science and Technology in Instrumentation and Technology”, multidisciplinary nature of measurement, microsystem technology, information management, instrumentation and measurement, instruments, metrology, micromechanical devices, peer to peer computing, space technology|
|Subjects:||FOR Classification > 0906 Electrical and Electronic Engineering
Faculty/School/Research Centre/Department > School of Engineering and Science
|Date Deposited:||21 Sep 2011 04:04|
|Last Modified:||21 Sep 2011 04:04|
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|Citations in Scopus:||0 - View on Scopus|
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