Micro-analytical Techniques for Imaging Erbium Doped Optical Fibers
Sidiroglou, Fotios and Huntington, Shane and Stern, Richard and Baxter, Gregory W and Roberts, Ann (2004) Micro-analytical Techniques for Imaging Erbium Doped Optical Fibers. In: Technical Digest: Symposium on Optical Fiber Measurements 2004 (NIST Special Publications 1024). National Institution of Standards and Technology, pp. 55-58. ISBN 1886843376Full text for this resource is not available from the Research Repository.
In this paper we demonstrate the application of two microscopic imaging techniques, Raman Fluorescence Intensity Confocal Optical Microscopy and Nano-Secondary Ion Mass Spectroscopy (NanoSIMS), to the determination of the relative erbium ion distribution in optical fibers. We also employ Quantitative Phase Microscopy (QPM) for the acquisition of the refractive index profile of one of the investigated samples. As well as being able to acquire two dimensional profiles of the relative erbium ion distribution, these methods can also provide valuable information on a submicron level regarding physical and optogeometric parameters of the examined samples.
|Item Type:||Book Section|
|Uncontrolled Keywords:||ResPubID: 7721, micro-analytical techniques, imaging Erbium Doped, optical fibers, quantitative phase microscopy, erbium ion distribution, optogeometric parameters|
|Subjects:||FOR Classification > 0906 Electrical and Electronic Engineering
Faculty/School/Research Centre/Department > School of Engineering and Science
|Date Deposited:||17 Dec 2009 03:57|
|Last Modified:||27 Jul 2011 02:08|
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|Citations in Scopus:||0 - View on Scopus|
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