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Acceptance testing, conformance and quality assurance of IEC61850 devices

Stojcevski, Blagojce and Kalam, Akhtar (2011) Acceptance testing, conformance and quality assurance of IEC61850 devices. In: Australian Protection Symposium 2011. Pretorius, Gawie, ed. OMICRON Electronics, Bundoora, Vic., pp. 56-59.

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Abstract

Symposium held in Sydney, Australia, August 23-24, 2011. Theme was Mastering change with smart testing

Item Type: Book Section
Uncontrolled Keywords: ResPubID23242, conformance, Factory Acceptance Test, Intelligent Electronic Device, Site Acceptance Test, substation automation system, quality assurance, SAS, SAT, IED
Subjects: Faculty/School/Research Centre/Department > School of Engineering and Science
FOR Classification > 0906 Electrical and Electronic Engineering
SEO Classification > 8599 Other Energy
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Depositing User: VUIR
Date Deposited: 23 Jan 2014 10:45
Last Modified: 09 Dec 2014 23:33
URI: http://vuir.vu.edu.au/id/eprint/9574
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