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Browse by Author: Chan, W-K

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Liu, Huai ORCID: 0000-0003-3125-4399, Xie, X, Yang, J, Lu, Y and Chen, T-Y (2010) Adaptive random testing by exclusion through test profile. In: The Tenth International Conference on Quality Software, 14 July 2010-15 July 2010, Zhangjiajie Shi, China.