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Browse by Author: Chen, T-Y

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Article

Liu, Huai ORCID: 0000-0003-3125-4399, Xie, X, Yang, J, Lu, Y and Chen, T-Y (2011) Adaptive random testing through test profiles. Software : Practice and Experience, 41 (10). 1131 - 1154. ISSN 0038-0644

Conference or Workshop Item

Liu, Huai ORCID: 0000-0003-3125-4399, Yusuf, I, Schmidt, H and Chen, T-Y (2014) Metamorphic fault tolerance: An automated and systematic methodology for fault tolerance in the absence of test oracle. In: 36th International Conference on Software Engineering (ICSE Companion 2014), 31 May 2014-07 June 2014, Hyderabad, India.

Zhang, X, Chen, T-Y and Liu, Huai ORCID: 0000-0003-3125-4399 (2014) An application of Adaptive Random Sequence in test case prioritization. In: 26th International Conference on Software Engineering and Knowledge Engineering, 01 July 2014-03 July 2014, Vancouver, Canada.

Liu, Huai ORCID: 0000-0003-3125-4399, Liu, X and Chen, T-Y (2012) A new method for constructing metamorphic relations. In: 12th International Conference on Quality Software (QSIC 2012), 27 August 2012-29 August 2012, Xi’an, Shaanxi, China.

Liu, Huai ORCID: 0000-0003-3125-4399, Xie, X, Yang, J, Lu, Y and Chen, T-Y (2010) Adaptive random testing by exclusion through test profile. In: The Tenth International Conference on Quality Software, 14 July 2010-15 July 2010, Zhangjiajie Shi, China.