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Browse by Author: Fan, C

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Sun, CA, Fan, C, Wang, Z and Liu, Huai ORCID: 0000-0003-3125-4399 (2017) dmuReg: A path-aware mutation analysis guided approach to regression testing. In: 12th International Workshop on Automation of Software Testing, 20 May 2017-21 May 2017, Buenos Aires, Argentina.