Application of a failure driven test profile in random testing
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Chen, Tsongyueh, Kuo, Fei-Ching and Liu, Huai 
ORCID: 0000-0003-3125-4399
(2009)
Application of a failure driven test profile in random testing.
IEEE Transactions on Reliability, 58 (1).
179 - 192.
ISSN 0018-9529
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| Item type | Article |
| URI | https://vuir.vu.edu.au/id/eprint/33050 |
| DOI | 10.1109/TR.2008.2011687 |
| Official URL | http://ieeexplore.ieee.org/document/4781593/ |
| Subjects | Historical > FOR Classification > 0803 Computer Software Current > Division/Research > College of Science and Engineering |
| Keywords | adaptive random testing; uniform distribution; operational profile; testing algorithms; failure detection |
| Citations in Scopus | 18 - View on Scopus |
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