Application of a failure driven test profile in random testing

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Chen, Tsongyueh, Kuo, Fei-Ching and Liu, Huai ORCID: 0000-0003-3125-4399 (2009) Application of a failure driven test profile in random testing. IEEE Transactions on Reliability, 58 (1). 179 - 192. ISSN 0018-9529

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Item type Article
DOI 10.1109/TR.2008.2011687
Official URL
Subjects Historical > FOR Classification > 0803 Computer Software
Current > Division/Research > College of Science and Engineering
Keywords adaptive random testing; uniform distribution; operational profile; testing algorithms; failure detection
Citations in Scopus 18 - View on Scopus
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