Adaptive Partition Testing

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Sun, Chang-ai ORCID: 0000-0003-3696-6176, Dai, Hepeng, Liu, Huai ORCID: 0000-0003-3125-4399, Chen, Tsongyueh and Cai, Kai-Yuan (2018) Adaptive Partition Testing. IEEE Transactions on Computers. ISSN 0018-9340

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Item type Article
DOI 10.1109/TC.2018.2866040
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Subjects Historical > FOR Classification > 0803 Computer Software
Current > Division/Research > College of Science and Engineering
Keywords software testing; Markov-chain based adaptive partition testing; reward-punishment based adaptive partition testing; Markov matrix; algorithms; random partition testing; RPT; dynamic random testing; DRT; fault-detection
Citations in Scopus 12 - View on Scopus
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