Acceptance testing, conformance and quality assurance of IEC61850 devices

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Stojcevski, Blagojce and Kalam, Akhtar ORCID: 0000-0002-5933-6380 (2011) Acceptance testing, conformance and quality assurance of IEC61850 devices. In: Australian Protection Symposium 2011. Pretorius, Gawie, ed. OMICRON Electronics, Bundoora, Vic., pp. 56-59.

Abstract

Symposium held in Sydney, Australia, August 23-24, 2011. Theme was Mastering change with smart testing

Item type Book Section
URI https://vuir.vu.edu.au/id/eprint/9574
Subjects Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Historical > FOR Classification > 0906 Electrical and Electronic Engineering
Historical > SEO Classification > 8599 Other Energy
Keywords ResPubID23242, conformance, Factory Acceptance Test, Intelligent Electronic Device, Site Acceptance Test, substation automation system, quality assurance, SAS, SAT, IED
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