The 24th Instrumentation and Measurement Technology Conference (IMTC 2007) had “Synergy of Science and Technology in Instrumentation and Technology” as its theme, emphasizing the multidisciplinary nature of measurement.  The keynote lecture of the conference, entitled MEMS in Metrology, was given by Prof. R. Jachowicz which illustrated how microsystem technology is already playing a significant role in many measurement applications and discussed the increasingly important role such technology will have in the future.