Schmidt, Heinz W

< Back to all Authors
[up] Up a level
Group by: Item type | Date
Jump to:
Conference or Workshop Item
Number of items: 3.

Conference or Workshop Item

Laali, Mohsen, Liu, Huai ORCID logoORCID: https://orcid.org/0000-0003-3125-4399, Hamilton, Margaret, Spichkova, Maria and Schmidt, Heinz W (2016) Test case prioritization using online fault detection information. In: Reliable software technologies -- Ada-Europe 2016 : 21st Ada-Europe International Conference on Reliable Software Technologies, 13 June 2016-17 June 2016, Pisa, Italy.

Barus, Arlinta, Chen, Tsongyueh, Kuo, Fei-Ching, Liu, Huai ORCID logoORCID: https://orcid.org/0000-0003-3125-4399 and Schmidt, Heinz W (2016) The impact of source test case selection on the effectiveness of metamorphic testing. In: 2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET), 16 May 2016-16 May 2016, Austin, Texas, USA.

Liu, Huai ORCID logoORCID: https://orcid.org/0000-0003-3125-4399, Yusuf, Iman I, Schmidt, Heinz W and Chen, Tsongyueh (2014) Metamorphic fault tolerance: An automated and systematic methodology for fault tolerance in the absence of test oracle. In: 36th International Conference on Software Engineering (ICSE Companion 2014), 31 May 2014-07 June 2014, Hyderabad, India.