Guest editorial: IMTC 2007 special issue

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Thorn, Richard and Gao, R (2008) Guest editorial: IMTC 2007 special issue. IEEE Transactions on Instrumentation and Measurement, 57 (8). pp. 1502-1503. ISSN 0018-9456

Abstract

The 24th Instrumentation and Measurement Technology Conference (IMTC 2007) had “Synergy of Science and Technology in Instrumentation and Technology” as its theme, emphasizing the multidisciplinary nature of measurement. The keynote lecture of the conference, entitled MEMS in Metrology, was given by Prof. R. Jachowicz which illustrated how microsystem technology is already playing a significant role in many measurement applications and discussed the increasingly important role such technology will have in the future.

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Item type Article
URI https://vuir.vu.edu.au/id/eprint/3996
DOI https://doi.org/10.1109/TIM.2008.926033
Official URL http://dx.doi.org/10.1109/TIM.2008.926033
Subjects Historical > FOR Classification > 0906 Electrical and Electronic Engineering
Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Keywords ResPubID16505, Instrumentation and Measurement Technology Conference (IMTC), “Synergy of Science and Technology in Instrumentation and Technology”, multidisciplinary nature of measurement, microsystem technology, information management, instrumentation and measurement, instruments, metrology, micromechanical devices, peer to peer computing, space technology
Citations in Scopus 0 - View on Scopus
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