Guest editorial: IMTC 2007 special issue

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Thorn, Richard and Gao, R (2008) Guest editorial: IMTC 2007 special issue. IEEE Transactions on Instrumentation and Measurement, 57 (8). pp. 1502-1503. ISSN 0018-9456

Abstract

The 24th Instrumentation and Measurement Technology Conference (IMTC 2007) had “Synergy of Science and Technology in Instrumentation and Technology” as its theme, emphasizing the multidisciplinary nature of measurement. The keynote lecture of the conference, entitled MEMS in Metrology, was given by Prof. R. Jachowicz which illustrated how microsystem technology is already playing a significant role in many measurement applications and discussed the increasingly important role such technology will have in the future.

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Item type	Article
URI	https://vuir.vu.edu.au/id/eprint/3996
DOI	10.1109/TIM.2008.926033
Official URL	http://dx.doi.org/10.1109/TIM.2008.926033
Subjects	Historical > FOR Classification > 0906 Electrical and Electronic Engineering Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Keywords	ResPubID16505, Instrumentation and Measurement Technology Conference (IMTC), “Synergy of Science and Technology in Instrumentation and Technology”, multidisciplinary nature of measurement, microsystem technology, information management, instrumentation and measurement, instruments, metrology, micromechanical devices, peer to peer computing, space technology
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