Near-field scanning optical microscopy with laser trapping

Ke, Pu Chun (2000) Near-field scanning optical microscopy with laser trapping. PhD thesis, Victoria University of Technology.

Abstract

This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging.

Item type Thesis (PhD thesis)
URI https://vuir.vu.edu.au/id/eprint/15616
Subjects Historical > FOR Classification > 0205 Optical Physics
Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Keywords Scanning probe microscopy, Lasers, optical microscopy, evanescent waves, depolarisation
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