Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy

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Sidiroglou, Fotios, Stern, Richard, Fletcher, Ian, Huntington, Shane, Baxter, Gregory W and Roberts, Ann (2006) Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy. In: Optical Fibre Technology/Australian Optical Society, 2006(ACOFT&AOS2006). IEEE, pp. 97-99.

Abstract

Dopant profiles in erbium doped optical fibres acquired by the application of fluorescence intensity based confocal microscopy technique and the employment of a nanoscale-secondary ion mass spectrometry (NanoSIMS) system are presented and compared

Item type Book Section
URI https://vuir.vu.edu.au/id/eprint/2089
Official URL http://dx.doi.org/10.1109/ACOFT.2006.4519301
ISBN 977565718
Subjects Historical > FOR Classification > 0906 Electrical and Electronic Engineering
Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Keywords ResPubID: 11787, doping profiles, erbium, fluorescence spectroscopy, ion microprobe analysis, optical fibres, secondary ion mass spectroscopy
Citations in Scopus 0 - View on Scopus
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