dmuReg: A path-aware mutation analysis guided approach to regression testing

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Sun, CA, Fan, C, Wang, Z and Liu, Huai ORCID logoORCID: https://orcid.org/0000-0003-3125-4399 (2017) dmuReg: A path-aware mutation analysis guided approach to regression testing. In: 12th International Workshop on Automation of Software Testing, 20 May 2017-21 May 2017, Buenos Aires, Argentina.

Abstract

Title on article is : dμReg: A path-aware mutation analysis guided approach to regression testing

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Item type Conference or Workshop Item (Paper)
URI https://vuir.vu.edu.au/id/eprint/36556
DOI 10.1109/AST.2017.8
Official URL https://ieeexplore.ieee.org/document/7962333/
ISBN 9781538615485
Subjects Historical > FOR Classification > 0803 Computer Software
Historical > Faculty/School/Research Centre/Department > School of Engineering and Science
Keywords regression testing activities; software testing; mutation testing
Citations in Scopus 5 - View on Scopus
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