Micro-analytical Techniques for Imaging Erbium Doped Optical Fibers
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Sidiroglou, Fotios, Huntington, Shane, Stern, Richard, Baxter, Gregory W and Roberts, Ann (2004) Micro-analytical Techniques for Imaging Erbium Doped Optical Fibers. In: Technical Digest: Symposium on Optical Fiber Measurements 2004 (NIST Special Publications 1024). National Institution of Standards and Technology, pp. 55-58.
Abstract
In this paper we demonstrate the application of two microscopic imaging techniques, Raman Fluorescence Intensity Confocal Optical Microscopy and Nano-Secondary Ion Mass Spectroscopy (NanoSIMS), to the determination of the relative erbium ion distribution in optical fibers. We also employ Quantitative Phase Microscopy (QPM) for the acquisition of the refractive index profile of one of the investigated samples. As well as being able to acquire two dimensional profiles of the relative erbium ion distribution, these methods can also provide valuable information on a submicron level regarding physical and optogeometric parameters of the examined samples.
| Item type | Book Section |
| URI | https://vuir.vu.edu.au/id/eprint/473 |
| Official URL | http://dx.doi.org/10.1109/SOFM.2004.183474 |
| ISBN | 1886843376 |
| Subjects | Historical > FOR Classification > 0906 Electrical and Electronic Engineering Historical > Faculty/School/Research Centre/Department > School of Engineering and Science |
| Keywords | ResPubID: 7721, micro-analytical techniques, imaging Erbium Doped, optical fibers, quantitative phase microscopy, erbium ion distribution, optogeometric parameters |
| Citations in Scopus | 0 - View on Scopus |
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